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Preparation of sample cross-sections and analysis by SIMS
Karlovský, Juraj ; Pechal, Radim (referee) ; Bábor, Petr (advisor)
This thesis studies possible methods of semiconductor sample measurement by SIMS, with emphasis on testing different measurement parameters and sample preparation. Part of this master thesis deals with the design of a modified sample holder compatible with the used ToF-SIMS$^{5}$ instrument, IONTOF company, which is capable of tilting the sample by defined angle. This holder enables sample preparation in the main chamber of the instrument without the need of transferring the sample between instruments, which limits the probability of sample contamination. This sample holder was tested by ion machining of TIGBT sample edge and by imaging of a crater edge, created in previous measurement. Edge termination structures prepared by different techniques were measured on the TIGBT samples. Further measurements with the goal of optimizing the depth resolution for thin layers were done on Molybdenum-Silicon-multilayer X-Ray Mirror. Part of the measurements was focused on comparing depth profiles measured at low temperatures. For these measurements the samples with Indium multilayers in GaN substrate were used.
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Surface Analysis by Photoelectrons – Computer Control of Experiments
Polčák, Josef ; Zemek, Josef (referee) ; Cháb, Vladimír (referee) ; Šikola, Tomáš (advisor)
Doctoral thesis is dealing with the methods for analysis of surfaces by photoelectrons being emitted by X-ray radiation. The methods are: X-ray Photoelectron Spectroscopy - XPS, Angle-resolved XPS - ARXPS and X-ray Photoelectron Diffraction - XPD. The work is especially focused on a method of ARXPS, which is used for the depth compositional analysis of sample surfaces. To obtain an information about the depth composition from the measured ARXPS spectra, a calculation software in the Matlab environment has been developed. The software has been tested both for simulated and real sample data. For an experimental implementation of these methods, a complete manipulation system has been developed. It ensures the transport of samples inside a vacuum apparatus and the experiment itself. The system is controlled mainly by a software and enables to run the experiments automatically.
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Depth profiling using laser-induced breakdown spectroscopy method
Průcha, Lukáš ; Novotný,, Karel (referee) ; Pořízka, Pavel (advisor)
The diploma thesis deals with the use of Laser-Induced Breakdown Spectroscopy (LIBS) for depth profiling and 3D mapping of the zinc-coated steel used in the automotive industry. Before creating depth maps and depth profiles, optimization of the experiment was performed. It was shown that the LIBS technique is suited for making depth profiles and depth maps. The theoretical part deals with the description of the LIBS instrumentation, characteristics of plasma, and assembling of scientific papers which reflect the up to date knowledge about depth profiling and mapping with the use of the LIBS technique. The experimental part describes the optimization of the experiment. Gate delay, the depth and the diameter of craters using the profilometer, the position of the focal plane relative to the sample surface, and selection of spectral lines with the smallest residual signal and small scattering of data were optimized. Depth profiles of zinc, iron, chromium and manganese with the depth map of zinc and iron were made, and also the depth resolution for both elements was calculated.
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Preparation of sample cross-sections and analysis by SIMS
Karlovský, Juraj ; Pechal, Radim (referee) ; Bábor, Petr (advisor)
This thesis studies possible methods of semiconductor sample measurement by SIMS, with emphasis on testing different measurement parameters and sample preparation. Part of this master thesis deals with the design of a modified sample holder compatible with the used ToF-SIMS$^{5}$ instrument, IONTOF company, which is capable of tilting the sample by defined angle. This holder enables sample preparation in the main chamber of the instrument without the need of transferring the sample between instruments, which limits the probability of sample contamination. This sample holder was tested by ion machining of TIGBT sample edge and by imaging of a crater edge, created in previous measurement. Edge termination structures prepared by different techniques were measured on the TIGBT samples. Further measurements with the goal of optimizing the depth resolution for thin layers were done on Molybdenum-Silicon-multilayer X-Ray Mirror. Part of the measurements was focused on comparing depth profiles measured at low temperatures. For these measurements the samples with Indium multilayers in GaN substrate were used.
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Depth profiling using laser-induced breakdown spectroscopy method
Průcha, Lukáš ; Novotný,, Karel (referee) ; Pořízka, Pavel (advisor)
The diploma thesis deals with the use of Laser-Induced Breakdown Spectroscopy (LIBS) for depth profiling and 3D mapping of the zinc-coated steel used in the automotive industry. Before creating depth maps and depth profiles, optimization of the experiment was performed. It was shown that the LIBS technique is suited for making depth profiles and depth maps. The theoretical part deals with the description of the LIBS instrumentation, characteristics of plasma, and assembling of scientific papers which reflect the up to date knowledge about depth profiling and mapping with the use of the LIBS technique. The experimental part describes the optimization of the experiment. Gate delay, the depth and the diameter of craters using the profilometer, the position of the focal plane relative to the sample surface, and selection of spectral lines with the smallest residual signal and small scattering of data were optimized. Depth profiles of zinc, iron, chromium and manganese with the depth map of zinc and iron were made, and also the depth resolution for both elements was calculated.
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Surface Analysis by Photoelectrons – Computer Control of Experiments
Polčák, Josef ; Zemek, Josef (referee) ; Cháb, Vladimír (referee) ; Šikola, Tomáš (advisor)
Doctoral thesis is dealing with the methods for analysis of surfaces by photoelectrons being emitted by X-ray radiation. The methods are: X-ray Photoelectron Spectroscopy - XPS, Angle-resolved XPS - ARXPS and X-ray Photoelectron Diffraction - XPD. The work is especially focused on a method of ARXPS, which is used for the depth compositional analysis of sample surfaces. To obtain an information about the depth composition from the measured ARXPS spectra, a calculation software in the Matlab environment has been developed. The software has been tested both for simulated and real sample data. For an experimental implementation of these methods, a complete manipulation system has been developed. It ensures the transport of samples inside a vacuum apparatus and the experiment itself. The system is controlled mainly by a software and enables to run the experiments automatically.
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